Servo Technologies for Micron Trackwidth
نویسندگان
چکیده
منابع مشابه
Burn-in Temperature Projections for Deep Sub-micron Technologies
Burn-in faces significant challenges in recent CMOS technologies. The self-generated heat of each IC in a burn-in environment contributes to larger currents that can lead to further increase in junction temperatures, possible thermal run away, and yield-loss of good parts. Calculations show that the junction temperature is increasing by 1.45X/generation. This paper estimates the increase in jun...
متن کاملTest Scheduling for Circuits in Micron to Deep Submicron Technologies
We discuss the test scheduling problem in this paper. We first provide a historical perspective of the original test scheduling formulation that dealt only with resource conflicts, followed by the consideration of power constraint test scheduling. We then move on to the recent formulations which include dealing with thermal constraint. We explain solutions, their limitations and the challenges ...
متن کاملAssessing SRAM test coverage for sub-micron CMOS technologies
This paper proposes a realistic memory fault probability model which predicts the probabilities of memory fault classes for a given process technology. Physical defects in the memory array are classified into five functional fault classes, which are stuck-at, stuck-open, transition, coupling, and data retention faults. Finally, the memory fault coverages of the known memory test algorithms are ...
متن کاملA Modified Noise Analysis of a Common Source ̶ Common Gate Low Noise Transconductance Amplifier for Sub-micron Technologies
This paper is based on analysis of a common source - common gate low noise transconductance amplifier (CS-CG LNTA). Conventional noise analyses equations are modified by considering to the low output impedance of the sub-micron transistors and also, parasitic gate-source capacitance. The calculated equations are more accurate than calculated equations in other works. Also, analyses show that th...
متن کاملDetection of Resistive Shorts in Deep Sub-micron Technologies
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-100 mA of a single core. Nevertheless this is not sufficient to handle the next generations of very deep sub-micron technologies. Moreover delay-fault testing and very-low voltage testing are not a real alternative for ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of the Magnetics Society of Japan
سال: 1992
ISSN: 1880-4004,0285-0192
DOI: 10.3379/jmsjmag.16.s1_111